15 July, 2026
MILADO partner Fraunhofer IAF was represented at ICMOVPE 2026 by Tom Meyer, who delivered an oral presentation about his recent research on “Impact of Growth Parameters on High Quality InP Microridges Grown Directly on On-Axis Si Substrates”.
The presentation included analysis results of growth parameters for high quality growth of InP in v-grooved Si trenches allowing aspect ratio trapping.
